[1] Cao Quanjun,Zhang Yimen, Zhang Yuming, Lv Hongliang,Wang Yuehu,Chang Yuancheng, Tang Xiaoyan ” A CAD Oriented quasi-analytical large signal drain current model for 4H-SiC MESFETs”, Chinese Physics B(IF:2.103,2007),2007, 16(4):1097-1100 (SCI: 000245213000039 EI:072410654205)
[2] Quanjun Cao, Yimen Zhang, Yuming Zhang, Hongliang Lv, Hui Guo, Xiaoyan Tang, Yuehu Wang,” A New Empirical Large Signal Model of 4H-SiC MESFETs for the Nonlinear Analysis”, Chinese Journal of Semiconductor, 2007, 28(7):1024-1029(EI: 073210754418)
[3] Cao Quanjun , Zhang Yimen , Zhang Yuming , Lv Hongliang, Wang Yuehu, Tang Xiaoyan, Guo Hui, ” Improved Empirical DC I-V Model for 4H-SiC MESFETs”, Science in China: Series F, 2008,51(8):1184-1192 (EI:083411474927,SCI:UT ISI: 000257394000017)
[4] Quanjun Cao, Yimen Zhang, Yuming Zhang” A new physics-based self-heating effect model for 4H-SiC MESFETs”, Chinese physics B(IF:2.103,2007), 2008,17(12):4622-4626(EI:082111273089,SCI检索)
Quanjun Cao, Yimen Zhang, Jia Lixin,” Model and analysis of Drain Induced Barrier Lowering Effect for 4H-SiC MESFETs ”, Vol.1, No.10,Oct., 2009(EI:20094512422246,SCI WOS:000270300600058)
[5] )
[6] 曹全君,张义门,张玉明,汤晓燕,吕红亮,王悦湖, “4H-SiC MESFET的新型经验电容模型”, 固体电子学研究与进展(EI: 083411474927),Vol.28(1),2008,p.33-37
[7] 曹全君,张义门,张玉明, “一种改进的4H-SiC MESFET大信号解析模型”,电子器件,2007年8月,30(4)pp.1148-1151
[8] 曹全君张义门 张玉明 吕红亮 王悦湖 汤晓燕 “基于电荷推导的4H-SiC MESFET大信号电容解析模型” 宽禁带半导体技术交流会中国北京2006.10
[9] Cao, Quanjun; Zhang, Yimen; Zhang, Yuming; Guo, Hui, A new self-heating effects model for 4H-SiC MESFETs, 2007 International Semiconductor Device Research Symposium, ISDRS, Dec 12-14 2007, College Park, MD, United States(EI: 082511321507)
[10] Cao Quanjun, Zhang Yimen, Zhang Yuming, Chang Yuancheng, ” A CAD Oriented 4H-SiC MESFET quasi-analytical large signal drain current model ”,IEEE IWJT,May 15-16 Shanghai, China, p268-272(EI:072510656208)
[11] Cao, Quanjun; Zhang, Yimen; Zhang, Yuming, An analytical model of drain induced barrier lowering effect for SiC MESFETs, IWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology, May 15-16 2008, Shanghai, China (EI: 083711526994, UT ISI:000256555000026)
[12] 曹全君, 张义门,张玉明 张甲阳,”新型4H-SiC MESFET大信号模型在ADS的实现”, 十六届半导体物理学术会议,兰州,2007.9
[13] 曹全君 张义门 张玉明 郭辉,4H-SiC MESFETs自热效应新模型,第十五届全国半导体集成电路硅材料学术会议,重庆,2007,10.30~11.2
[14] 吕红亮,张义门,张玉明,车勇,曹全君,郑少金,Physical based model for trapping and self-heating effects in 4H-SiC MESFETs,Applied Physics A: Materials Science and Processing,Vol. 91, n 2, May, 2008, pp. 287~290, EI:081311173999,SCI: UT ISI:000254086700015
[15] Chang Yuancheng, Zhang Yimen, Zhang Yuming, Wang Chao and Cao Quanjun, “Parameter Extraction for Small Signal Equivalent Circuit of AlGaN/GaN High Electron Mobility Transistors”, Chinese Journal of Electron Devices(电子器件),2007,30(1) pp.50-53(第五作者,英文)
[16] Chang Yuancheng, Zhang Yimen, Zhang Yuming, Cao Quanjun and Wang Chao, “An Analytical Model of Large Signal DC I-V Characteristics for AlGaN/GaN High Electron Mobility Transistors”, Chinese Journal of Electron Devices(电子器件),2007,30(2)pp.353-355(第四作者,英文)
[17] 邵科; 曹全君; 张义门; 张玉明; 孙明; 基于陷阱的4H-SiC MESFET频散效应分析, 微电子学,37(6), 2007年12月,pp.830-832
[18] 曹全君 贾立新 王涌,数字电路教学中规范触发器概念的思考,高等理科教育,教育教学研究专辑(二),2009年9月,p.29-31,(教学论文)